Velocity Saturation and Mobility Degradation
Ideal model assumes carrier velocity increases linearly with electric field. In reality, at high and vertical electric fields, carrier velocity saturates, and mobility degrades due to scattering
Saturation Current with Velocity Saturation
$$
I_{\text{dsat}} = W C_{ox} v_{sat} \frac{V_{GT}^{2}}{V_{GT} + V_c}
$$
- Where $V_{GT} = V_{gs} - V_t \text{ and }V_c = E_c L$ is the critical voltage where velocity saturates
Full Velocity Saturated Limit
$$
I_{\text{dsat}} \approx W C_{ox} v_{sat} V_{GT}
$$
- Current depends linearly on $V_{gs}$
Alpha-Power Law Model
$$
I_{\text{dsat}} = P_c \frac{\beta}{2} V_{GT}^{\alpha}
$$
- $\alpha$ is the velocity saturation index between 1 (fully saturated) and 2 (long-channel)
- nMOS transistors typically have a lower $\alpha$ than pMOS
Channel Length Modulation
Depletion region around the drain grows with $V_{ds}$, shortening the channel length
- In saturation, $I_{ds}$ is not constant bu increases with $V_{ds}$
Early Voltage Model
$$
I_{ds} = \frac{\beta}{2} V_{GT}^2 \left( 1 + \frac{V_{ds}}{V_A} \right)
$$
- Where $V_A$ is the early voltage
Threshold Voltage Effects
Body Effect